# Semiconductor device and failue analysis: using photon emission microscopy by Wai Kin Chim

Semiconductor device and failue analysis: using photon emission microscopy by Wai Kin Chim is available to buy at Bookshop.org.

- Author: Wai Kin Chim
- Publisher: Wiley
- Pages: 269
- ISBN-13: 9780471492405
- Category: More Books Books

## Where to buy

- Bookshop.org: see price at store · https://madlime.com/go/637128-637128

[Live page](https://madlime.com/product/semiconductor-device-and-failue-analysis-using-photon-emission-microscopy-637128)

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